Electron Microscopy

Instruments

FEI Quanta 200 Environmental Scanning Electron Microscope
The FEI Quanta 200 is scheduled to be installed in early November 2015. The Quanta200 can be operated in regular high-vacuum, low-vacuum and full Environmental ESEM modes for imaging many varieties of samples. It will be equipped with iXRF software/hardware and an e2v SSD EDS detector which can measure >300,000 x-ray counts/second.
Location: AIL

Resources

As part of sample preparation, samples are coated to improve conductivity with Au/Pt or Ir.  These can often be seen in the XRF spectrum and are also often misidentified.  Check out the X-Ray data booklet to find X-ray emission lines.
X-Ray DataBooklet